About

The Bruker Dimension XR Atomic Force Microscope is a cutting-edge nanoscale imaging system designed for advanced research applications. It combines high-resolution AFM imaging with expanded functionality to support nanomechanical, electrical, magnetic, and chemical measurements. The Dimension XR platform is known for its flexible modular architecture, allowing users to perform the most challenging nanoscience investigations with precision, repeatability, and ease of use.

Note-The price mentioned above is for reference only. Do not consider it for purchase. For the actual price and more product details, please contact us at +91 98508 70860, +91 84461 74263

• Multimodal AFM capabilities: electrical, mechanical, and chemical property mapping

• High-resolution 3D surface imaging

• PeakForce Tapping technology for accurate force control

• Advanced automation and workflow simplicity

• Compatibility with a wide range of sample sizes and environments

• Integrated software for analysis and data visualization

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