Bruker Atomic Force Microscope Dimension Edge

उत्पाद वर्णन

The Bruker Dimension Edge Atomic Force Microscope (AFM) is a high-resolution scanning probe microscope designed for advanced materials research and nanotechnology applications. It combines industry-leading AFM performance with user-friendly operation in a compact benchtop design. Equipped with PeakForce Tapping technology, it provides exceptional imaging resolution and precise control of tip-sample interaction forces, enabling accurate surface characterization across a wide variety of samples and environments.

Note

The price mentioned above is for reference only. Do not consider it for purchase. For the actual price and more product details, please contact us at +91 98508 70860, +91 84461 742

KEY FEATURES

• Advanced PeakForce Tapping technology for high-resolution imaging
  Compact benchtop platform with full research-grade performance

• Automated laser and detector alignment

• Real-time data analysis and live image rendering

• Supports multiple imaging modes: topography, phase, modulus, conductivity, and more

• Low noise floor for atomic and molecular resolution

• Fast scanning capabilities for improved throughput

• Easy-to-use software interface for routine and expert users

• Industry Served

• Nanotechnology and Materials Science Research
  Semiconductor and Electronics Industry

• Polymer and Thin Film Analysis

• Life Sciences and Biomedical Research

• Academic and Industrial Research Institutions

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