Bruker Atomic Force Microscope Dimension Edge

Bruker Atomic Force Microscope Dimension Edge Specification

Shape
Rectangular main frame

Display Type
Integrated digital interface, external PC monitor

Speed Range
Up to 15 Hz scanning rate (line scan rate)

Power Supply
AC mains supplied, universal

Glass Type
Fused Silica Glass for sample stages and optical windows

Features
PeakForce Tapping technology, automated laser alignment, high-resolution imaging, low-noise electronics, closed-loop scan

Accuracy
Z-axis noise <0.4 RMS (in air), XY-linearity <0.1%

Control Type
Motorized with computer control

Temperature Resistance
Ambient to 60C

Type
Atomic Force Microscope

Dimension (L*W*H)
585 mm x 576 mm x 322 mm

Equipment Type
Laboratory Analytical Instrument

Equipment Materials
Metal frame, vibration isolation materials, high-grade electronics

Power
100-240 V AC, 50/60 Hz

Voltage
100-240 V

Material
Precision-engineered metallic alloys, glass, composite polymer parts

Application
High-resolution surface imaging, nano-scale characterization, materials science, life sciences, semiconductor analysis

Data Output Formats
TIFF, JPEG, proprietary formats, ASCII

Software
NanoScope Analysis Suite

Vertical Range
Up to 10 µm

Tip Positioning
Automated and manual

Imaging Modes
AFM, Tapping Mode, PeakForce Tapping, PhaseImaging, Nanoindentation

Max Scan Size
90 µm x 90 µm

Scanner Type
High-performance closed-loop XY and Z scanners

Sample Size
Up to 210 mm diameter

Noise Floor
<0.4 Å RMS in air

Weight
Approximately 61 kg

Vibration Isolation
Integrated active vibration control

Connectivity
USB, Ethernet

Bruker Atomic Force Microscope Dimension Edge Trade Information

Minimum Order Quantity
1 Piece

Main Export Market(s)
Asia, Australia, Central America, North America, South America, Eastern Europe, Western Europe, Middle East

About Bruker Atomic Force Microscope Dimension Edge

The Bruker Dimension Edge Atomic Force Microscope (AFM) is a high-resolution scanning probe microscope designed for advanced materials research and nanotechnology applications. It combines industry-leading AFM performance with user-friendly operation in a compact benchtop design. Equipped with PeakForce Tapping technology, it provides exceptional imaging resolution and precise control of tip-sample interaction forces, enabling accurate surface characterization across a wide variety of samples and environments.

Note

The price mentioned above is for reference only. Do not consider it for purchase. For the actual price and more product details, please contact us at +91 98508 70860, +91 84461 742

KEY FEATURES

Advanced PeakForce Tapping technology for high-resolution imaging
Compact benchtop platform with full research-grade performance
Automated laser and detector alignment
Real-time data analysis and live image rendering
Supports multiple imaging modes: topography, phase, modulus, conductivity, and more
Low noise floor for atomic and molecular resolution
Fast scanning capabilities for improved throughput
Easy-to-use software interface for routine and expert users
Industry Served

Nanotechnology and Materials Science Research
Semiconductor and Electronics Industry
Polymer and Thin Film Analysis
Life Sciences and Biomedical Research
Academic and Industrial Research Institutions

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High-Resolution Imaging Performance

Equipped with advanced PeakForce Tapping technology and closed-loop scan controls, the Dimension Edge delivers exceptional image clarity down to sub-nanometer detail. Automated laser alignment and low-noise electronics further enhance reliability, making it ideal for precise surface analyses required in cutting-edge research.

Versatile Applications Across Disciplines

Designed to meet the demands of materials science, life sciences, and semiconductor analysis, this AFM accommodates large samples and offers multiple imaging modes such as Tapping Mode, PeakForce Tapping, and Nanoindentation. Researchers across disciplines benefit from its accuracy and flexibility.

User-Friendly Control and Data Management

The integrated digital interface, external PC connectivity, and NanoScope Analysis Suite software streamline operation and post-acquisition analysis. Data can be exported in several formats-including TIFF, JPEG, and ASCII-ensuring compatibility with lab workflows and publication requirements.

FAQ's of Bruker Atomic Force Microscope Dimension Edge:

Q: How does the Dimension Edge ensure precise tip positioning and scanning accuracy?

A: The Dimension Edge uses high-performance closed-loop XY and Z scanners coupled with both automated and manual tip positioning, delivering exceptional accuracy with XY-linearity better than 0.1% and a Z-axis noise floor below 0.4 A RMS in air.

Q: What types of imaging modes are available on this atomic force microscope?

A: This system supports a range of imaging modes including standard AFM, Tapping Mode, PeakForce Tapping, PhaseImaging, and Nanoindentation, allowing users to tailor measurements to diverse sample types and investigative needs.

Q: When should I use the integrated active vibration control feature?

A: The integrated active vibration control should be used during high-resolution imaging and sensitive surface analyses to minimize external vibrations and ensure the highest fidelity data acquisition, especially in laboratory environments with unavoidable mechanical noise.

Q: Where can the Dimension Edge be deployed for research applications?

A: This AFM is designed for use in laboratories focused on materials science, life sciences, semiconductor research, and nano-scale surface analysis. Its ability to accommodate samples up to 210 mm in diameter makes it suitable for both industrial and academic settings.

Q: What is the process for acquiring and analyzing AFM data with this system?

A: Users position samples on fused silica glass stages, select imaging modes via the computer-controlled interface, then acquire images or force measurements. Collected data is processed and analyzed using NanoScope Analysis Suite, with results exportable in multiple industry-standard formats.

Q: How does the Dimension Edge benefit materials or semiconductor researchers?

A: Researchers gain high-resolution surface imaging capability, accurate nanoindentation measurements, and reliable repeatability due to advanced scanner technology and vibration control, enabling exploration of material properties, device topography, and failure analysis at the nanoscale.

Q: What are the connectivity and data output options for this equipment?

A: The device offers USB and Ethernet connectivity for data transfer and remote control. Data can be output in TIFF, JPEG, proprietary, and ASCII formats, supporting integration into various laboratory workflows and reporting processes.

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