Bruker Atomic Force Microscope Innova

Product Description

The Bruker Innova Atomic Force Microscope (AFM) offers high-resolution imaging and advanced scanning capabilities for a wide range of nanotechnology applications. Known for its mechanical stability and precision, the Innova is ideal for researchers seeking a cost-effective solution without compromising on performance. It supports numerous AFM modes and provides excellent control over tip-sample interactions, making it a preferred choice for material science, nanomechanics, and life science studies.

Note

The price mentioned above is for reference only. Do not consider it for purchase. For the actual price and more product details, please contact us at +91 98508 70860, +91 84461 74263

Key Features

High-resolution AFM imaging with excellent signal-to-noise ratio

• Closed-loop scanner for accurate positioning and measurement

• Versatile support for contact, tapping, and advanced AFM modes

• Easy tip and sample exchange with intuitive user interface

• Low noise and thermal drift for long-duration experiments

• Integrated software suite for complete system control and data analysis

• Compact, vibration-resistant design ideal for standard lab environments

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