The Bruker MultiMode 8-HR Atomic Force Microscope delivers exceptional resolution, performance, and application flexibility for nanoscale research. Designed with PeakForce Tapping technology and an ultra-low-noise scanner, the MultiMode 8-HR is widely recognized as the industry benchmark for high-resolution atomic force microscopy. It supports a wide range of modes and accessories, enabling detailed nanomechanical, electrical, and material property characterization with sub-nanometer precision.
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KEY FEATURES
Industry-leading sub-nanometer resolution imaging
PeakForce Tapping for gentle, high-precision measurements
Exceptional mechanical and electrical property mapping
High-speed, low-noise scanner technology
Wide compatibility with fluid and environmental control modules
Upgradeable platform to accommodate emerging research needs
Intuitive interface with Bruker NanoScope software
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